DocumentCode :
3231504
Title :
Discriminative low-rank metric learning for face recognition
Author :
Zhengming Ding ; Sungjoo Suh ; Jae-Joon Han ; Changkyu Choi ; Yun Fu
Author_Institution :
Dept. of Electr. & Comput. Eng., Northeastern Univ., Boston, MA, USA
fYear :
2015
fDate :
4-8 May 2015
Firstpage :
1
Lastpage :
6
Abstract :
Metric learning has attracted increasing attentions recently, because of its promising performance in many visual analysis applications. General supervised metric learning methods are designed to learn a discriminative metric that can pull all the within-class data points close enough, while pushing all the data points with different class labels far away. In this paper, we propose a Discriminative Low-rank Metric Learning method (DLML), where the metric matrix and data representation coefficients are both constrained to be low-rank. Therefore, our approach can not only dig out the redundant features with a low-rank metric, but also discover the global data structure by seeking a low-rank representation. Furthermore, we introduce a supervised regularizer to preserve more discriminative information. Different from traditional metric learning methods, our approach aims to seek low-rank metric matrix and low-rank representation in a discriminative low-dimensional subspace at the same time. Two scenarios of experiments, (e.g. face verification and face identification) are conducted to evaluate our algorithm. Experimental results on two challenging face datasets, e.g. CMU-PIE face dataset and Labeled Faces in the Wild (LFW), reveal the effectiveness of our proposed method by comparing with other metric learning algorithms.
Keywords :
face recognition; image representation; learning (artificial intelligence); matrix algebra; CMU-PIE face dataset; DLML; LFW; Labeled Faces in the Wild; data representation coefficients; discriminative low-dimensional subspace; discriminative low-rank metric learning; face identification; face recognition; face verification; low-rank image representation; low-rank metric matrix; supervised metric learning methods; visual analysis applications; within-class data points; Face; Face recognition; Learning systems; Measurement; Optimization; Robustness; Training;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Automatic Face and Gesture Recognition (FG), 2015 11th IEEE International Conference and Workshops on
Conference_Location :
Ljubljana
Type :
conf
DOI :
10.1109/FG.2015.7163088
Filename :
7163088
Link To Document :
بازگشت