• DocumentCode
    3231781
  • Title

    Managing the negative impact of recipe diversity on wet process tools and capacity: a multi-fabricator model

  • Author

    Carpenter, Nicole ; Hilscher, David F.

  • Author_Institution
    Microelectron. Div., IBM Corp., Essex Junction, VT, USA
  • fYear
    1999
  • fDate
    1999
  • Firstpage
    168
  • Lastpage
    171
  • Abstract
    This paper describes the results of a multi-fabricator site team in minimizing recipe diversity; the metrics used to measure the progress of the team are also defined. By identifying and measuring the differences in recipe and process locations within a route, process changes were implemented to make the process operations more standard between various fabricators and the technologies at a given fabricator. This work has resulted in eliminating unnecessary cleans, minimizing differences between various technologies, eliminating chemistries used for only a few recipes, and propagating the best practices among the fabricators
  • Keywords
    batch processing (industrial); integrated circuit yield; manufacturing resources planning; semiconductor process modelling; surface cleaning; technology transfer; batching jobs for processing; capacity loss; cleaning; complex technology transfer; delays to market; engineering overhead; increased chemical usage; multi-fabricator model; negative impact; recipe diversity; standard process operations; wet process tools; Chemical processes; Chemical technology; Chemistry; Delay; Manufacturing processes; Microelectronics; Rivers; Routing; Semiconductor device manufacture; Technology transfer;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Advanced Semiconductor Manufacturing Conference and Workshop, 1999 IEEE/SEMI
  • Conference_Location
    Boston, MA
  • ISSN
    1078-8743
  • Print_ISBN
    0-7803-5217-3
  • Type

    conf

  • DOI
    10.1109/ASMC.1999.798214
  • Filename
    798214