Title :
A system-level non-linear behavioral modeling of pulling and pushing mechanisms in PLLs
Author :
Ranaivoniarivo, Manohiaina ; Wane, Sidina ; Richalot, Elodie ; Picon, Odile
Author_Institution :
NXP Semicond., Caen, France
Abstract :
In this paper, system-level nonlinear behavioral modeling of pulling and pushing mechanisms in PLLs is presented. Intentional interruptions based FIBs (Focused Ion Beam) cutting of identified critical power/ground paths show the importance of electromagnetic coupling. The modeling results are compared to measurements and finally, physical interpretations are discussed.
Keywords :
cutting; electromagnetic coupling; focused ion beam technology; phase locked loops; PLL; critical power-ground paths; electromagnetic coupling; focused ion beam cutting; pulling-pushing mechanisms; system-level nonlinear behavioral modeling; Analytical models; Frequency measurement; Integrated circuit modeling; Noise; Phase locked loops; Voltage-controlled oscillators; Behavioral Modeling; PLL; Pulling; pushing;
Conference_Titel :
Circuits and Systems (APCCAS), 2010 IEEE Asia Pacific Conference on
Conference_Location :
Kuala Lumpur
Print_ISBN :
978-1-4244-7454-7
DOI :
10.1109/APCCAS.2010.5775026
