DocumentCode
3232208
Title
The modeling and experiments of a PVDF mirco-force sensor
Author
Liu, Yiyang ; Yu, Peng ; Wang, Yuechao ; Dong, Zaili ; Xi, Ning
Author_Institution
Shenyang Inst. of Autom., Chinese Acad. of Sci., Shenyang
fYear
2008
fDate
6-9 Jan. 2008
Firstpage
60
Lastpage
64
Abstract
This paper aims at designing a kind of advanced micro-force sensor that can measure force in the range of sub- micro-Newton (muN). To accurately measure the micro interactive force (for example, adhesion, surface tension, friction, and assembly force) acting on micro devices during micromanipulation, the polyvinylidene fluoride (PVDF) is fabricated highly sensitive force sensors. This paper illustrates the modeling method of a PVDF sensor. The transformation between the micro interactive force and the output of the sensor is described. To calibrate the transformation, the model of the PVDF cantilever beam that shows the relationship between the interactive force and the deflection of the sensor probe tip is built first. Then, by given deflection, the interactive force can be calculated with the model. Finally, the transformation can be calibrated. Experiment results verify the effectiveness and accuracy of the transformation model, and the sub-muN sensitivity of the sensor. This micro force sensing technology will solve an important problem that restricts the development of micromanipulation and batch assembly of micro devices.
Keywords
beams (structures); calibration; cantilevers; force measurement; force sensors; microassembling; microsensors; sensitivity; PVDF micro force sensor modeling; cantilever beam; micro interactive force measurement; microassembling; micromanipulation; polyvinylidene fluoride; sensitivity; transformation calibration; Assembly; Atomic force microscopy; Capacitive sensors; Force measurement; Force sensors; Magnetic sensors; Optical sensors; Piezoelectric materials; Piezoresistance; Probes; PVDF; micro-force; microassembly; sensor;
fLanguage
English
Publisher
ieee
Conference_Titel
Nano/Micro Engineered and Molecular Systems, 2008. NEMS 2008. 3rd IEEE International Conference on
Conference_Location
Sanya
Print_ISBN
978-1-4244-1907-4
Electronic_ISBN
978-1-4244-1908-1
Type
conf
DOI
10.1109/NEMS.2008.4484286
Filename
4484286
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