• DocumentCode
    3232228
  • Title

    Design of a self-stirring micromixer at low Reynolds number flow

  • Author

    Shih, T.R. ; Chung, C.K. ; Wang, C.H.

  • Author_Institution
    Center for Micro/Nano Technol. Res., Nat. Cheng Kung Univ., Tainan
  • fYear
    2008
  • fDate
    6-9 Jan. 2008
  • Firstpage
    65
  • Lastpage
    68
  • Abstract
    In order to improve the complicated fabrication process and integration of 3D micromixers, we propose a novel planar self-stirring micromixer with high mixing efficiency and low pressure drop. The planar micromixer with vortices agitation for mixing enhancement had been successfully investigated by the Taguchi method, CFD-ACE simulations and experiments. The factor sensitivity test was performed by L9(34) orthogonal array in Taguchi method. Degree of sensitivity ranks as: Gap ratio > Number of mixing units > Baffle width > Chamber ratio. At Re = 20, micromixer shows 93% mixing efficiency in the adaptive design with three mixing units, H/W = 1/8, Wm/W = 1 and Wm = 80. The corresponding pressure drop of this adaptive design is only 4600 Pa at Re 20. Much improved mixing is obtained experimentally in this adaptive design at Re 20. The results of the factor sensitivity test can provide useful information for the design of the micromixers with obstacles. Merits of this design are easy fabrication and high integration capability.
  • Keywords
    Taguchi methods; computational fluid dynamics; laminar flow; microfluidics; mixing; vortices; 3D micromixers; Taguchi method; low Reynolds number flow; low pressure drop; planar self-stirring micromixer; self-stirring micromixer design; vortices agitation; Bonding; Boundary conditions; Charge-coupled image sensors; Design engineering; Fabrication; Navier-Stokes equations; Optical microscopy; Signal to noise ratio; Systems engineering and theory; Testing; micromixer; mixing; obstacles;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nano/Micro Engineered and Molecular Systems, 2008. NEMS 2008. 3rd IEEE International Conference on
  • Conference_Location
    Sanya
  • Print_ISBN
    978-1-4244-1907-4
  • Electronic_ISBN
    978-1-4244-1908-1
  • Type

    conf

  • DOI
    10.1109/NEMS.2008.4484287
  • Filename
    4484287