• DocumentCode
    3232315
  • Title

    Oxidation of high area ratio silicon microchannels fabricated by electrochemical etching

  • Author

    Chen, Xiaoming ; Lin, Jilei ; Xu, Shaohui ; Xin, Peisheng ; Wang, Lianwei

  • Author_Institution
    Dept. of Electron. Eng., East China Normal Univ., Shanghai
  • fYear
    2008
  • fDate
    6-9 Jan. 2008
  • Firstpage
    78
  • Lastpage
    81
  • Abstract
    Silicon microchannel structures exhibit numerous possible applications. In this report, the oxidation of high area ratio silicon microchannels used in weak light detection and night vision is studied. High area ratio microchannels are fabricated by electrochemical etching, and the influences of oxidation time and environments on the microstructures are investigated and analyzed combined with computer simulation. Damages and distortion are found after the oxidation process. It is found that after oxidation at high temperature, surface morphology becomes rough and followed polishing step is recommended to smooth the silicon microchannels´ surfaces.
  • Keywords
    etching; microchannel plates; micromechanical devices; night vision; oxidation; polishing; electrochemical etching; high area ratio silicon microchannel oxidation; night vision; silicon microchannel structures; silicon microchannels; weak light detection; Application software; Etching; Microchannel; Microstructure; Night vision; Oxidation; Rough surfaces; Silicon; Surface morphology; Surface roughness; HF concentration; high aspect ratio; microchannel; oxidation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nano/Micro Engineered and Molecular Systems, 2008. NEMS 2008. 3rd IEEE International Conference on
  • Conference_Location
    Sanya
  • Print_ISBN
    978-1-4244-1907-4
  • Electronic_ISBN
    978-1-4244-1908-1
  • Type

    conf

  • DOI
    10.1109/NEMS.2008.4484290
  • Filename
    4484290