DocumentCode
3232315
Title
Oxidation of high area ratio silicon microchannels fabricated by electrochemical etching
Author
Chen, Xiaoming ; Lin, Jilei ; Xu, Shaohui ; Xin, Peisheng ; Wang, Lianwei
Author_Institution
Dept. of Electron. Eng., East China Normal Univ., Shanghai
fYear
2008
fDate
6-9 Jan. 2008
Firstpage
78
Lastpage
81
Abstract
Silicon microchannel structures exhibit numerous possible applications. In this report, the oxidation of high area ratio silicon microchannels used in weak light detection and night vision is studied. High area ratio microchannels are fabricated by electrochemical etching, and the influences of oxidation time and environments on the microstructures are investigated and analyzed combined with computer simulation. Damages and distortion are found after the oxidation process. It is found that after oxidation at high temperature, surface morphology becomes rough and followed polishing step is recommended to smooth the silicon microchannels´ surfaces.
Keywords
etching; microchannel plates; micromechanical devices; night vision; oxidation; polishing; electrochemical etching; high area ratio silicon microchannel oxidation; night vision; silicon microchannel structures; silicon microchannels; weak light detection; Application software; Etching; Microchannel; Microstructure; Night vision; Oxidation; Rough surfaces; Silicon; Surface morphology; Surface roughness; HF concentration; high aspect ratio; microchannel; oxidation;
fLanguage
English
Publisher
ieee
Conference_Titel
Nano/Micro Engineered and Molecular Systems, 2008. NEMS 2008. 3rd IEEE International Conference on
Conference_Location
Sanya
Print_ISBN
978-1-4244-1907-4
Electronic_ISBN
978-1-4244-1908-1
Type
conf
DOI
10.1109/NEMS.2008.4484290
Filename
4484290
Link To Document