DocumentCode :
3232354
Title :
Research of thick-film capacitive displacement sensors used in nano-meter scaled operation
Author :
Ma, Yiwu ; Zhang, Zaochun ; Gao, Lisheng
Author_Institution :
State Key Lab. of Transducer Technol., Chinese Acad. of Sci., Hefei
fYear :
2008
fDate :
6-9 Jan. 2008
Firstpage :
90
Lastpage :
94
Abstract :
On the basis of thick-film technology, a novel gap- variation-type thick-film capacitive micro-displacement sensor have been developed to detect nanometer-scaled displacement, using 96% A12O3 ceramic plates and Pd-Ag conducting paste via a print-fire process. This paper describes the principle, structural design and theoretic computation of the capacitive sensor. Factors affecting the sensors´ resolution and linearity, and effects of materials and technological parameters are also discussed. Tests results of the preliminary prototype sensors show that the as-prepared prototype sensors possess good linearity (about 2%, without additional compensation or corrections) and resolution (about 0.025/100 nm). The obtained results demonstrate that the sensors have favorable applied prospects.
Keywords :
alumina; capacitive sensors; ceramics; displacement measurement; thick film sensors; ceramic plates; conducting paste; nanometer scaled operation; print-fire process; thick-film capacitive displacement sensors; Aluminum oxide; Capacitive sensors; Ceramics; Intelligent sensors; Optical distortion; Optical feedback; Optical films; Probes; Thick film sensors; Thick films; ceranics; micro-displacement measurement; nanotechnology; thick film capacitive sensor;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nano/Micro Engineered and Molecular Systems, 2008. NEMS 2008. 3rd IEEE International Conference on
Conference_Location :
Sanya
Print_ISBN :
978-1-4244-1907-4
Electronic_ISBN :
978-1-4244-1908-1
Type :
conf
DOI :
10.1109/NEMS.2008.4484293
Filename :
4484293
Link To Document :
بازگشت