DocumentCode
3232357
Title
Experimental investigation of dual wave optimized reflector stacks in solidly mounted resonators
Author
Jose, S. ; Hueting, R.J.E.
Author_Institution
MESA+ Inst. for Nanotechnol., Univ. of Twente, Enschede, Netherlands
fYear
2011
fDate
18-21 Oct. 2011
Firstpage
1234
Lastpage
1237
Abstract
Optimizing the reflector stacks for both longitudinal and shear waves is critical in the design of SMRs for high Quality factor (Q) filters. In this work, we experimentally investigate two design approaches for reflector stack optimization, i.e. the phase error approach and the diffraction grating method (DGM). Various SiO2/W reflector stacks were fabricated and analyzed: one stack using DGM and four others using the phase error approach. The extracted ID Q shows the expected trend except for the quarter-wave like stack. 2D FEM simulations reveal that the quarter-wave stack with an increased top-oxide layer shows improved shear reflection. The DGM stack showed the highest experimental Q of 1700. The results indicate that these approaches are applicable for any reflector stack combination.
Keywords
Q-factor; acoustic resonators; bulk acoustic wave devices; diffraction gratings; filters; finite element analysis; optical elements; optimisation; silicon compounds; tungsten; 1D Q extraction; 2D FEM simulations; DGM stack; Q filters; SMR; SiO2-W; diffraction grating method; dual wave optimized reflector stacks; phase error approach; quality factor filters; quarter-wave stack; reflector stack optimization; shear reflection; shear waves; solidly mounted resonators; top-oxide layer; Acoustics; Bulk Acoustic Wave (BAW); Diffraction grating method (DGM); Dual wave reflection; Solidly Mounted Resonator (SMR);
fLanguage
English
Publisher
ieee
Conference_Titel
Ultrasonics Symposium (IUS), 2011 IEEE International
Conference_Location
Orlando, FL
ISSN
1948-5719
Print_ISBN
978-1-4577-1253-1
Type
conf
DOI
10.1109/ULTSYM.2011.0304
Filename
6293532
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