• DocumentCode
    3232518
  • Title

    Impedance matching of laser diodes using packaged microstrip lines: active and passive

  • Author

    Biernacki, Pawel ; Mickelson, Alan R.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Colorado Univ., Boulder, CO, USA
  • Volume
    1
  • fYear
    1995
  • fDate
    30-31 Oct 1995
  • Firstpage
    238
  • Abstract
    Summary form only given. Impedance matching of laser diodes using packaged microstrip structures is discussed for both active and passive matching networks. The first step in accomplishing any reasonable match to driving a laser diode requires a careful measurement of the input impedance of the packaged laser diode. Although the nonlinear behavior of a laser diode presents a frequency dependent impedance and is dependent upon the threshold current, the impedance of the Mitsubishi laser diode used in our case was given as approximately a series resistance of 4 ohms plus an inductance of 3 nanoHenrys for a frequency range of 0.5 GHz to 5 GHz when the laser is modulated above threshold. The task to be accomplished then is to provide a matching circuit to the laser diode providing an efficient throughput of modulator power. An example of a simple single stub matching circuit fabricated on microstrip is shown. The results of both the passive and active matching circuits will be presented
  • Keywords
    active networks; impedance matching; microstrip circuits; optical modulation; passive networks; semiconductor lasers; 0.5 to 5 GHz; 4 ohm; active matching networks; frequency dependent impedance; impedance matching; laser diodes; packaged microstrip lines; passive matching networks; single stub matching circuit; threshold current; Circuits; Diode lasers; Electrical resistance measurement; Frequency dependence; Impedance matching; Impedance measurement; Inductance; Microstrip; Packaging; Threshold current;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Lasers and Electro-Optics Society Annual Meeting, 1995. 8th Annual Meeting Conference Proceedings, Volume 1., IEEE
  • Conference_Location
    San Francisco, CA
  • Print_ISBN
    0-7803-2450-1
  • Type

    conf

  • DOI
    10.1109/LEOS.1995.484850
  • Filename
    484850