Quick screen of thermal resistance for batching high brightness LEDs

This paper presents a method of quick thermal resistance screen for batching high brightness LEDs. The thermal resistance distribution is obtained by the screen instrument using temperature sensitive parameter (TSP) method. By comparing the measurement results of initial samples and the screened samples with unqualified products discarded, both the expectation and the variance decrease. Therefore, the uniformity and reliability are enhanced through screening. In the application of LED array system, the total lifetime of the array and the reliability will be improved highly by this method. This study provides practical principle and reference value in the production and application of batching high brightness LEDs.