Estimation of obliquely scattered gamma-ray response functions in the gross-count tomographic gamma scanner (GC-TGS) method

It was recently shown that a logarithmic response-function technique based on the material basis set (MBS) formalism used in the tomographic gamma scanner (TGS) method allows gross spectra from NaI detectors to be used in both measuring MBS transmission corrections using external transmission sources and in applying the corrections to emission spectra to arrive at radionuclide mass estimates. In this work we have attempted to show that addition of the oblique scatter component can increase the accuracy of the GC-TGS measurements with both NaI and high-purity germanium detectors. This paper describes the formalism behind the GC-TGS method and the improvement achieved in the analysis by including the scatter component