Title :
High quality uniform random number generation for massively parallel simulations in FPGA
Author :
Thomas, David B. ; Luk, Wayne
Author_Institution :
Dept. of Comput., Imperial Coll., London
Abstract :
This paper details the design and implementation of three uniform random number generators for use in massively parallel simulations in FPGAs. The three different generators are tailored to make use of three different types of hardware resource: logic, RAM, and DSP blocks. This allows the random number generator to be fitted into resources left-over after the main application has been written. The three generators all pass the most stringent empirical statistical tests for randomness, and all have periods appropriate for long running simulations
Keywords :
digital signal processing chips; field programmable gate arrays; logic design; random number generation; random-access storage; DSP; FPGA; RAM; logic block; parallel simulation; random number generation; statistical test; Computational modeling; Concurrent computing; Digital signal processing; Field programmable gate arrays; Hardware; Logic testing; Parallel processing; Random number generation; Random sequences; Read-write memory;
Conference_Titel :
Reconfigurable Computing and FPGAs, 2005. ReConFig 2005. International Conference on
Conference_Location :
Puebla City
Print_ISBN :
0-7695-2456-7
DOI :
10.1109/RECONFIG.2005.24