Title :
Heterogeneous parallel yield-driven electromagnetic CAD
Author :
Bandler, John W. ; Biernacki, R.M. ; Cai, Q. ; Chen, S.H. ; Grobelny, P.A. ; Swanson, D.G.
Author_Institution :
Dept. of Electr. & Comput. Eng., McMaster Univ., Hamilton, Ont., Canada
Abstract :
Within an integrated parallel optimization framework, we are able, for the first time, to apply electromagnetic (EM) optimization to the yield-driven design of microstrip circuits of arbitrary geometries. Parallel optimization handles the massive demand on computer resources, due to the large number of designable parameters describing an arbitrary geometry and the large number of simulations involved in yield optimization. Our parallel strategy can be implemented over local and wide area networks supporting heterogeneous workstations.<>
Keywords :
MMIC; circuit CAD; circuit analysis computing; circuit optimisation; integrated circuit design; integrated circuit yield; microstrip circuits; MMICs; arbitrary geometries; circuit CAD; circuit simulation; computer resources; designable parameters; electromagnetic optimization; heterogeneous workstations; integrated parallel optimization framework; local area networks; microstrip circuits; wide area networks; yield-driven design; Circuit simulation; Computational geometry; Computational modeling; Computer simulation; Concurrent computing; Design automation; Design optimization; Integrated circuit yield; Microstrip; Solid modeling;
Conference_Titel :
Microwave Symposium Digest, 1995., IEEE MTT-S International
Conference_Location :
Orlando, FL, USA
Print_ISBN :
0-7803-2581-8
DOI :
10.1109/MWSYM.1995.406160
