Heterogeneous parallel yield-driven electromagnetic CAD

Author

Bandler, John W. ; Biernacki, R.M. ; Cai, Q. ; Chen, S.H. ; Grobelny, P.A. ; Swanson, D.G.

Author_Institution

Dept. of Electr. & Comput. Eng., McMaster Univ., Hamilton, Ont., Canada

fYear

1995

fDate

16-20 May 1995

Firstpage

1085

Abstract

Within an integrated parallel optimization framework, we are able, for the first time, to apply electromagnetic (EM) optimization to the yield-driven design of microstrip circuits of arbitrary geometries. Parallel optimization handles the massive demand on computer resources, due to the large number of designable parameters describing an arbitrary geometry and the large number of simulations involved in yield optimization. Our parallel strategy can be implemented over local and wide area networks supporting heterogeneous workstations.<>

Keywords

MMIC; circuit CAD; circuit analysis computing; circuit optimisation; integrated circuit design; integrated circuit yield; microstrip circuits; MMICs; arbitrary geometries; circuit CAD; circuit simulation; computer resources; designable parameters; electromagnetic optimization; heterogeneous workstations; integrated parallel optimization framework; local area networks; microstrip circuits; wide area networks; yield-driven design; Circuit simulation; Computational geometry; Computational modeling; Computer simulation; Concurrent computing; Design automation; Design optimization; Integrated circuit yield; Microstrip; Solid modeling;

fLanguage

English

Publisher

ieee

Conference_Titel

Microwave Symposium Digest, 1995., IEEE MTT-S International

Conference_Location

Orlando, FL, USA

ISSN

0149-645X

Print_ISBN

0-7803-2581-8

Type

conf

DOI

10.1109/MWSYM.1995.406160

Filename

406160