Title :
An improved method of extracting permittivity combined SVM and waveguide theory
Author :
Xiao, Huaibao ; Lu, Guizhen ; Zhang, Li ; Li, Xiaoru
Author_Institution :
Commun. Univ. of China, Beijing, China
Abstract :
A new method of determining permittivity by SVM is studied in this paper. The mapping relationship between the S parameters and the permittivity is set up by calculating a large number of S parameters from the samples with different permittivity using waveguide theory. The simulated data set is used as training data set for SVM. After being trained, the SVM is used to predict the permittivity of material from the scattering coefficients. The validity of the method is also verified using FEM.
Keywords :
S-parameters; electrical engineering computing; finite element analysis; permittivity; support vector machines; waveguide theory; FEM; S parameters; Waveguide Theory; permittivity extraction; scattering coefficients; simulated data set; support vector machine; training data set; Electromagnetic measurements; Electromagnetic scattering; Electromagnetic waveguides; Electronic equipment; Permeability; Permittivity measurement; Rectangular waveguides; Scattering parameters; Support vector machines; Waveguide theory;
Conference_Titel :
Microwave and Millimeter Wave Technology (ICMMT), 2010 International Conference on
Conference_Location :
Chengdu
Print_ISBN :
978-1-4244-5705-2
DOI :
10.1109/ICMMT.2010.5525030
