Title :
High-speed ADC dynamic performance validation: The impact of skew-corner lot testing
Author :
Kim, Seokjin ; Peckerar, Martin
Author_Institution :
Dept. of Electr. & Comput. Eng., Univ. of Maryland, College Park, MD
Abstract :
Corner-lot process statistics have been demonstrated to provide important data on component yield and functionality. In this paper, we review the basics of this statistical approach and we show how they are applied to the dynamic performance of a high-speed (800 MS/s) dual channel 6-bit ADC. The skew-corner ADC performance test results allow us to determine (a) the quality the semiconductor fabricate process, (b) the sufficiency of the high speed ADC test and measurement equipment, and (c) which process parameters dominate yield.
Keywords :
analogue-digital conversion; high-speed integrated circuits; semiconductor device testing; analog-digital conversion; corner-lot process statistics; dual channel; dynamic performance validation; high-speed ADC; measurement equipment; semiconductor fabricate process; skew-corner lot testing; word length 6 bit; Analog-digital conversion; Analytical models; Circuit testing; Fabrication; Integrated circuit measurements; Performance analysis; Process control; Sampling methods; Semiconductor device testing; Silicon; Analog-to-digital converter (ADC); corner lot; process variation; sampling; skew-corner;
Conference_Titel :
AUTOTESTCON, 2008 IEEE
Conference_Location :
Salt Lake Cirty, UT
Print_ISBN :
978-1-4244-2225-8
Electronic_ISBN :
1088-7725
DOI :
10.1109/AUTEST.2008.4662578
