• DocumentCode
    3234423
  • Title

    Multiresolution sensor fusion approach to PCB fault detection and isolation

  • Author

    Wright, R. Glenn

  • Author_Institution
    GMA Ind., Inc., Annapolis, MD
  • fYear
    2008
  • fDate
    8-11 Sept. 2008
  • Firstpage
    41
  • Lastpage
    46
  • Abstract
    This paper describes a novel approach to printed circuit board (PCB) testing that fuses the products of individual, non-traditional sensors to draw conclusions regarding overall PCB health and performance. This approach supplements existing parametric test capabilities with the inclusion of sensors for electromagnetic emissions, laser Doppler vibrometry, off-gassing and material parameters, and X-ray and Terahertz spectral images of the PCB. This approach lends itself to the detection and prediction of entire classes of anomalies, degraded performance, and failures that are not detectable using current automatic test equipment (ATE) or other test devices performing end-to-end diagnostic testing of individual signal parameters. This greater performance comes with a smaller price tag in terms of non-recurring development and recurring maintenance costs over currently existing test program sets. The complexities of interfacing diverse and unique sensor technologies with the PCB are discussed from both the hardware and software perspective. Issues pertaining to creating a whole-PCB interface, not just at the card-edge connectors, are addressed. In addition, we discuss methods of integrating and interpreting the unique software inputs obtained from the various sensors to determine the existence of anomalies that may be indicative of existing or pending failures within the PCB. Indications of how these new sensor technologies may comprise future test systems, as well as their retrofit into existing test systems, will also be provided.
  • Keywords
    automatic test equipment; fault simulation; printed circuit testing; sensor fusion; PCB fault detection; PCB health; automatic test equipment; card-edge connectors; end-to-end diagnostic testing; fault isolation; individual nontraditional sensors; multiresolution sensor fusion approach; parametric test capabilities; printed circuit board testing; test program sets; whole-PCB interface; Automatic testing; Circuit testing; Electrical fault detection; Fault detection; Fuses; Printed circuits; Sensor fusion; Signal resolution; System testing; X-ray lasers; ATE; EME; ICs; TPS; X-ray; automatic test equipment; electromagnetic emissions; integrated circuits; nanotechnology; printed circuit board; sensor fusion; test program set;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    AUTOTESTCON, 2008 IEEE
  • Conference_Location
    Salt Lake Cirty, UT
  • ISSN
    1088-7725
  • Print_ISBN
    978-1-4244-2225-8
  • Electronic_ISBN
    1088-7725
  • Type

    conf

  • DOI
    10.1109/AUTEST.2008.4662581
  • Filename
    4662581