• DocumentCode
    3234602
  • Title

    Justifying DFT with a hierarchical top-down cost-benefit model

  • Author

    Davidson, Scott

  • Author_Institution
    Sun Microsyst., Inc., Sunnyvale, CA
  • fYear
    2008
  • fDate
    8-11 Sept. 2008
  • Firstpage
    74
  • Lastpage
    79
  • Abstract
    How can we justify system level DFT? We must show that it has a positive return on investment. Existing test ROI models are manufacturing centric, do not account for the disaggregation of the product realization process, and are often focused on a specific DFT method. We propose a new, top-down, hierarchical ROI model, which starts with potential benefits and can handle entire systems more effectively than current models.
  • Keywords
    cost-benefit analysis; design for testability; design for testability; hierarchical top-down cost-benefit model; product realization process; return on investment; system level DFT; test ROI models; Cities and towns; Costs; Design for testability; Integrated circuit modeling; Integrated circuit testing; Investments; Production facilities; System testing; Uncertainty; Virtual manufacturing; DFT; Return on Investment; Test Economics;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    AUTOTESTCON, 2008 IEEE
  • Conference_Location
    Salt Lake Cirty, UT
  • ISSN
    1088-7725
  • Print_ISBN
    978-1-4244-2225-8
  • Electronic_ISBN
    1088-7725
  • Type

    conf

  • DOI
    10.1109/AUTEST.2008.4662588
  • Filename
    4662588