• DocumentCode
    3234625
  • Title

    InGaN/GaN multiple quantum wells with silicon delta doping in GaN barriers for light-emitting diodes

  • Author

    Wu, G.M. ; Chung, T.J. ; Nee, T.E. ; Wang, J.C. ; Lu, H.C.

  • Author_Institution
    Inst. of Electro-Opt. Eng., Chang Gung Univ., Taoyuan
  • fYear
    2008
  • fDate
    6-9 Jan. 2008
  • Firstpage
    596
  • Lastpage
    599
  • Abstract
    In this paper, silicon delta doping was incorporated in the GaN barriers of InGaN/GaN multiple quantum well (MQW) structures for blue light-emitting diodes. High-order satellite peaks from X-ray diffraction suggested indium incorporation in the hetero-structures. The indium content has been 0.171 and 0.192 for the silicon delta doped and undoped samples, respectively, by Vegard´s rule. Thermodynamic analysis by Arrhenius plots of the temperature-dependent photoluminescence spectra revealed the enhancements in radiative recombination. The activation energy was shown to be 130 meV for the InGaN/GaN MQW structures with silicon delta doping. It was 110 meV for the undoped samples. The increase in the thermal activation energy was attributed to the supply of electrons from the silicon delta doping barrier region into the InGaN quantum wells. The hole-capturing by higher energy barrier in the valence band was also increased. Silicon delta doping suppresses carrier leakage by increasing exciton confinement, and therefore improves the quantum efficiency.
  • Keywords
    doping; light emitting diodes; quantum wells; In; InGaN-GaN; X-ray diffraction; blue light-emitting diodes; exciton confinement; hole-capturing; multiple quantum well structures; radiative recombination; silicon delta doping; temperature-dependent photoluminescence spectra; thermal activation energy; thermodynamic analysis; valence band; Doping; Gallium nitride; Indium; Light emitting diodes; Photoluminescence; Quantum well devices; Satellites; Silicon; Thermodynamics; X-ray diffraction; gallium nitride; multiple quantum well; photoluminescence; silicon doping;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nano/Micro Engineered and Molecular Systems, 2008. NEMS 2008. 3rd IEEE International Conference on
  • Conference_Location
    Sanya
  • Print_ISBN
    978-1-4244-1907-4
  • Electronic_ISBN
    978-1-4244-1908-1
  • Type

    conf

  • DOI
    10.1109/NEMS.2008.4484403
  • Filename
    4484403