DocumentCode
3234626
Title
The economics of harm prevention through Design for Testability
Author
Ungar, Louis Y.
Author_Institution
A.T.E. Solutions, Inc., Los Angeles, CA
fYear
2008
fDate
8-11 Sept. 2008
Firstpage
80
Lastpage
87
Abstract
Design for testability (DFT) has been accepted as a cost saving approach in many applications. The rationale has been demonstrated in several papers by calculations showing how DFT benefits derived outweigh costs. In those cases benefits dealt with cost savings in producing, testing and deploying a product. Apparently, such benefits are bound by an upper limit as the savings could not be greater than the cost of making the product. In this paper, however, we model the revenue generation capability of a product through its life cycle and demonstrate that the impact on profits by poor quality products can be much greater. DFT can mitigate many of the causes for poor quality products. We provide examples of recent economic harm and disaster caused by defective electronics. For these examples we postulate what DFT could have done to mitigate the defects and how much money the companies could have saved if DFT prevented the problems. Benefits derived from DFT in the product life cycle combines with traditionally demonstrated DFT benefits in production, making DFT even more compelling.
Keywords
built-in self test; cost-benefit analysis; design for testability; economics; life cycle costing; DFT benefits; defective electronics; design for testability; harm prevention economics; poor quality products; product life cycle; revenue generation capability; Algorithm design and analysis; Automatic testing; Built-in self-test; Circuit testing; Costs; Design for testability; Electronic equipment testing; Integrated circuit testing; Investments; Performance evaluation; BIST; Built-In Self Test; DFT; Design for Testability; return on investment; testability economics;
fLanguage
English
Publisher
ieee
Conference_Titel
AUTOTESTCON, 2008 IEEE
Conference_Location
Salt Lake Cirty, UT
ISSN
1088-7725
Print_ISBN
978-1-4244-2225-8
Electronic_ISBN
1088-7725
Type
conf
DOI
10.1109/AUTEST.2008.4662589
Filename
4662589
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