• DocumentCode
    3234626
  • Title

    The economics of harm prevention through Design for Testability

  • Author

    Ungar, Louis Y.

  • Author_Institution
    A.T.E. Solutions, Inc., Los Angeles, CA
  • fYear
    2008
  • fDate
    8-11 Sept. 2008
  • Firstpage
    80
  • Lastpage
    87
  • Abstract
    Design for testability (DFT) has been accepted as a cost saving approach in many applications. The rationale has been demonstrated in several papers by calculations showing how DFT benefits derived outweigh costs. In those cases benefits dealt with cost savings in producing, testing and deploying a product. Apparently, such benefits are bound by an upper limit as the savings could not be greater than the cost of making the product. In this paper, however, we model the revenue generation capability of a product through its life cycle and demonstrate that the impact on profits by poor quality products can be much greater. DFT can mitigate many of the causes for poor quality products. We provide examples of recent economic harm and disaster caused by defective electronics. For these examples we postulate what DFT could have done to mitigate the defects and how much money the companies could have saved if DFT prevented the problems. Benefits derived from DFT in the product life cycle combines with traditionally demonstrated DFT benefits in production, making DFT even more compelling.
  • Keywords
    built-in self test; cost-benefit analysis; design for testability; economics; life cycle costing; DFT benefits; defective electronics; design for testability; harm prevention economics; poor quality products; product life cycle; revenue generation capability; Algorithm design and analysis; Automatic testing; Built-in self-test; Circuit testing; Costs; Design for testability; Electronic equipment testing; Integrated circuit testing; Investments; Performance evaluation; BIST; Built-In Self Test; DFT; Design for Testability; return on investment; testability economics;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    AUTOTESTCON, 2008 IEEE
  • Conference_Location
    Salt Lake Cirty, UT
  • ISSN
    1088-7725
  • Print_ISBN
    978-1-4244-2225-8
  • Electronic_ISBN
    1088-7725
  • Type

    conf

  • DOI
    10.1109/AUTEST.2008.4662589
  • Filename
    4662589