• DocumentCode
    3234686
  • Title

    Research on Si-based MEMS process in development 3D millimeter-wave multi-chip module package

  • Author

    Wu, Liang ; Wang, Huajiang ; Tang, Jiajie ; Qian, Rong ; Hou, Yang ; Wang, Wei ; Hao, Sun ; Li, Lingyun ; Sun, Xiaowei ; Luo, Le

  • Author_Institution
    Shanghai Inst. of Micro-Syst. & Inf. Technol., Chinese Acad. of Sci. Shanghai, Shanghai, China
  • fYear
    2010
  • fDate
    8-11 May 2010
  • Firstpage
    1049
  • Lastpage
    1052
  • Abstract
    A low cost & feasible system on package solution on the basis of BCB and silicon wafer (10 Ohm·mm)-Si-Based 3D MMCM package solution is presented in this paper. What is more, a standard Si-Based MEMS process is employed to achieve package and revision of a GaAs-Based Monolithic Amplifier circuit. The measured results show that input return loss is less than 20 dB; moreover, small signal gain is more than 17 dB across 21 GHz to 26 GHz. The excellent measured results make the Si-based 3D-MMCM package solution a very attractive and feasible candidate for millimeter-wave 3D system level package applications. It is a step towards achievement of 3D system level package meeting excellent millimeter-wave performance.
  • Keywords
    III-V semiconductors; gallium arsenide; micromechanical devices; millimetre wave circuits; multichip modules; silicon; wafer level packaging; 3D millimeter-wave multichip module package; 3D system level package; GaAs; MEMS process; MMCM package solution; Si; millimeter-wave 3D system level package applications; monolithic amplifier circuit; Costs; Electronics packaging; Integrated circuit interconnections; Integrated circuit packaging; MMICs; Micromechanical devices; Millimeter wave communication; Millimeter wave measurements; Millimeter wave radar; Millimeter wave technology; Amplifier; GaAs MMIC; MMCM; Millimeter-wave; System on package;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave and Millimeter Wave Technology (ICMMT), 2010 International Conference on
  • Conference_Location
    Chengdu
  • Print_ISBN
    978-1-4244-5705-2
  • Type

    conf

  • DOI
    10.1109/ICMMT.2010.5525098
  • Filename
    5525098