• DocumentCode
    3234755
  • Title

    Automating HIL test setup and execution

  • Author

    Shende, Prabodh ; Scarfe, Darren ; Meek, Wyatt ; Krishna, Suresh

  • Author_Institution
    VI Eng., Inc., Farmington Hills, MI
  • fYear
    2008
  • fDate
    8-11 Sept. 2008
  • Firstpage
    118
  • Lastpage
    121
  • Abstract
    This paper describes an overview of the integrated test system for insuring interoperability of the various Electronic Control Modules (ECUs) of the electrical bench sub systems. This system has the following primary objectives: (1) To configure the electrical system bench using the existing configuration files for each wiring harness , Electronic Control Modules (ECU) and various devices/components, (2) To automate the integrity testing of the system bench, (3) To design a test executive for multiple test procedures for a bench that will be executed in unattended mode for long periods of time, up to several days, (4) To create a data repository for all files associated with a particular bench including; test procedures with test parameters, device configuration files, application description files and ECU flash files, (5) To utilize a standard, open architecture that allows for effortless swapping of hardware devices and software applications in the future to reduce or eliminate vendor dependence, (6) To increase the amount of automation possible by allowing multiple software applications and devices to freely communicate between one another and allow devices to control other devices.
  • Keywords
    automatic testing; design for testability; modules; ECU flash files; automating HIL test setup; electrical bench sub systems; electronic control modules; integrated test system; integrity testing; interoperability; multiple software applications; multiple test procedures; Application software; Automatic control; Automatic testing; Communication standards; Communication system software; Control systems; Electronic equipment testing; Software testing; System testing; Wiring; ASAM-GDI; ECU; Electrical Bench System; HIL; database;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    AUTOTESTCON, 2008 IEEE
  • Conference_Location
    Salt Lake Cirty, UT
  • ISSN
    1088-7725
  • Print_ISBN
    978-1-4244-2225-8
  • Electronic_ISBN
    1088-7725
  • Type

    conf

  • DOI
    10.1109/AUTEST.2008.4662596
  • Filename
    4662596