• DocumentCode
    3235154
  • Title

    A flexible family of PXI RF/MW Down Converter modules

  • Author

    Granieri, Michael N. ; Pragastis, Peter ; Mahal, Charanbir

  • Author_Institution
    Phase Matrix Inc, San Jose, CA
  • fYear
    2008
  • fDate
    8-11 Sept. 2008
  • Firstpage
    243
  • Lastpage
    248
  • Abstract
    This paper is in support of a recent small business innovative research (SBIR) phase II development effort. The objective of the effort was to design and develop a family of radio frequency (RF) and microwave (MW) down converter modules in a small form factor called PXI (PCI extension for instrumentation) for use in a synthetic instrument (SI) measurement context over a target frequency range of 100 KHz to 26.5 GHz. At the present time the current state of the art for RF/MW measurement instrumentation in a PXI form factor is limited to approximately 6 GHz. The paper opens with an overview of the subject and scope of this development initiative. The paper then goes on to describe the purpose and functionality of each of the down converter modules. The authors then describe how the modules can be configured into any number of seven (7) SI solution configurations, with particular emphasis on the 100 KHz - 26.5 GHz configuration. The paper then concludes with a summary overview and conclusions arrived at by the authors as a result of this developmental effort, as well as a future prognosis for this technology.
  • Keywords
    UHF frequency convertors; UHF measurement; automatic test equipment; microwave measurement; millimetre wave frequency convertors; PCI extension; PXI RF-MW down converter modules; frequency 100 kHz to 26.5 GHz; microwave down converter modules; radio frequency down converter modules; small business innovative research phase II development; synthetic instrument measurement; Current measurement; Frequency conversion; Frequency measurement; Instruments; Matrix converters; Radio frequency; Software testing; System testing; Time measurement; US Department of Defense; Down Converter; SI; Synthetic Instrument;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    AUTOTESTCON, 2008 IEEE
  • Conference_Location
    Salt Lake Cirty, UT
  • ISSN
    1088-7725
  • Print_ISBN
    978-1-4244-2225-8
  • Electronic_ISBN
    1088-7725
  • Type

    conf

  • DOI
    10.1109/AUTEST.2008.4662619
  • Filename
    4662619