DocumentCode :
3235306
Title :
Ultrashort optical interconnections of peripheral devices for next generation data processing systems
Author :
Lysak, V.V.
fYear :
2011
fDate :
5-9 Sept. 2011
Firstpage :
1
Lastpage :
2
Abstract :
We present a theoretical and experimental analysis on the static and modulation characteristics of components for 10 Gb/s ultrashort optical interconnects. Numerical analysis of geometrical parameters for optical light source and detector shows optimal values where bandwidth is maximal. Intracavity-contacted oxide confined vertical cavity surface emitted lasers and resonant cavity enhanced photodiode are presented as good choice for next generation high-speed optical interconnects.
Keywords :
high-speed optical techniques; numerical analysis; optical interconnections; surface emitting lasers; bit rate 10 Gbit/s; geometrical parameters; intracavity-contacted oxide confined vertical cavity surface emitted lasers; modulation characteristics; next generation data processing systems; next generation high-speed optical interconnects; numerical analysis; optical detector; optical light source; peripheral devices; resonant cavity enhanced photodiode; static characteristics; ultrashort optical interconnections; Indexes; Integrated optics; Lasers; Lead; Optical device fabrication; Optical modulation; Optical sensors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Laser and Fiber-Optical Networks Modeling (LFNM), 2011 11th International Conference on
Conference_Location :
Kharkov
ISSN :
Pending
Print_ISBN :
978-1-61284-811-2
Type :
conf
DOI :
10.1109/LFNM.2011.6144973
Filename :
6144973
Link To Document :
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