• DocumentCode
    3235312
  • Title

    Study on multi-scale-based 3-D surface topography evaluation algorithm

  • Author

    Wang, Jun ; Kang, Yan

  • Author_Institution
    Sch. of Mech. Sci. & Eng., Huazhong Univ. of Sci. & Technol., Wuhan
  • fYear
    2008
  • fDate
    6-9 Jan. 2008
  • Firstpage
    774
  • Lastpage
    779
  • Abstract
    In machining and testing field of MEMS parts, due to anisotropy commonly exists in some technics, the evaluation for 3D surface topography is a difficult program. Existing evaluation algorithm is short of representation capability. Based on discussing of extracting methods of surface topography characteristics, the contourlet Transform (CT) which may provide tight bracing and mutli-scale analysis was introduced. We present a new 3-D surface topography evaluation algorithm. This algorithm has some excellent performances such as multi-scale analysis, high-resolution, time-frequency- localization and multi-directions. And it is good at describing high dimensions data. Meanwhile, according to the theory that noise is not correlated with signal, correlation theory was explored as Discriminant Function. The contourlet transform is rebuilt to an adaptive filter based on this discriminant. Thus high-frequency noise, roughness and waviness information may be separated from. However, we found a question in experiment, so a datum plane was established according to the definition of flatness. Above-mentioned CT and two discriminants may be seen as three low-pass filter banks from the view of filtering. Thus, microcosmical 3-D surface topography of a part may be appraised finely under the three filters work together. The algorithm is verified by simulations. A conclusion can be draw that this algorithm can reliably obtain benchmark of appraisemnt. And the surface information of measured part can be extracted and analyzed without distortion. Comparing with existent 3-D surface topography evaluation algorithm, this method is preponderant in practicality of MEMS and nano surface evaluation.
  • Keywords
    micromechanical devices; surface topography; wavelet transforms; contourlet transform; discriminant function; multiscale-based 3D surface topography; Algorithm design and analysis; Anisotropic magnetoresistance; Appraisal; Filter bank; Low pass filters; Machining; Micromechanical devices; Performance analysis; Surface topography; Testing; MEMS; contourlet tansform; correlation; surface topography;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nano/Micro Engineered and Molecular Systems, 2008. NEMS 2008. 3rd IEEE International Conference on
  • Conference_Location
    Sanya
  • Print_ISBN
    978-1-4244-1907-4
  • Electronic_ISBN
    978-1-4244-1908-1
  • Type

    conf

  • DOI
    10.1109/NEMS.2008.4484441
  • Filename
    4484441