Title :
Full-wave analysis of the influence of conductor shape and structure details on losses in coplanar waveguide
Author :
Schroeder, W. ; Wolff, I.
Author_Institution :
Dept. of Electr. Eng., Duisburg Univ., Germany
Abstract :
The influence of technological details like two-layer structure of conducting strips, layer misalignment, non-rectangular conductor shape, dielectric cover or support layers on losses in CPW with small lateral dimensions is investigated by means of the hybrid-wave Boundary Integral Equation Method (BIEM). A short account of recent developments in this method, as required for this investigation, is given with focus on two concepts of general interest, the Method of Least Squares with Intermediate Projection (MLSIP) and a regularization approach.<>
Keywords :
boundary integral equations; coplanar waveguides; least squares approximations; losses; waveguide theory; MLSIP; coplanar waveguide; dielectric cover; full-wave analysis; hybrid-wave boundary integral equation method; lateral dimensions; layer misalignment; losses; method of least squares with intermediate projection; nonrectangular conductor shape; regularization approach; structure details; support layers; Conductors; Coplanar waveguides; Dielectric losses; Galvanizing; Integral equations; Integrated circuit modeling; Permittivity; Propagation constant; Shape; Strips;
Conference_Titel :
Microwave Symposium Digest, 1995., IEEE MTT-S International
Conference_Location :
Orlando, FL, USA
Print_ISBN :
0-7803-2581-8
DOI :
10.1109/MWSYM.1995.406203
