Manipulation of carbon nanotubes (CNTs) profile by pre-annealed Ni/Ti/Si substrate

Author

Peng, H.C. ; Chieng, C.C. ; Tsai, C.H. ; Tseng, F.G.

Author_Institution

Dept. of Eng. & Syst. Sci., Nat. Tsing Hua Univ., Hsinchu

fYear

2008

fDate

6-9 Jan. 2008

Firstpage

812

Lastpage

815

Abstract

Well aligned CNTs on Ni/Ti/Si substrate were presented in this paper by the employment of pre-annealing process to the adhesive layer(Ti). SEM images show both the alignment and uniformity of the CNTs on pre-annealed substrates are better than that on non-treated substrate. The wall structures of the CNTs were also characterized and demonstrated different organizations. By this pre-annealing process, better current density could be achieved for the well- aligned CNTs from cyclic voltammetry test.

Keywords

annealing; carbon nanotubes; current density; scanning electron microscopy; voltammetry (chemical analysis); C; Ni-Ti-Si; SEM; adhesive layer; carbon nanotubes profile; current density; cyclic voltammetry test; preannealed substrate; scanning electron microscopy; wall structures; Adhesives; Annealing; Argon; Atmosphere; Carbon nanotubes; Electrodes; Iron; Nickel; Testing; Thermal conductivity; Nickel (Ni); Thermal CVD; Titanic (Ti); carbon nanotubes (CNTs); cyclic voltammetry(CV);

fLanguage

English

Publisher

ieee

Conference_Titel

Nano/Micro Engineered and Molecular Systems, 2008. NEMS 2008. 3rd IEEE International Conference on

Conference_Location

Sanya

Print_ISBN

978-1-4244-1907-4

Electronic_ISBN

978-1-4244-1908-1

Type

conf

DOI

10.1109/NEMS.2008.4484448

Filename

4484448