A path sensitization technique for testing of switched capacitor circuits

Author

Biswas, Sounil ; Mazhari, Baquer

Author_Institution

Center for Silicon Syst. Integration, Carnegie Mellon Univ., Pittsburgh, PA, USA

fYear

2003

fDate

4-8 Jan. 2003

Firstpage

30

Lastpage

35

Abstract

In this work, we describe a new method for testing of switched capacitor (SC) circuits, based on modeling the circuit as a charge transfer graph. Based on the differences between the graphs of good and faulty circuits, one or more paths are identified such that upon their sensitization the difference in output voltage of the good and faulty circuits becomes appreciable. The validity of the proposed technique is demonstrated using the examples of SC lossy integrator, voltage amplifier and biquad filter circuits. It is shown that the proposed technique is efficient in testing both catastrophic as well as parametric faults in the capacitors.

Keywords

amplifiers; biquadratic filters; circuit simulation; circuit testing; graphs; integrating circuits; mixed analogue-digital integrated circuits; switched capacitor filters; switched capacitor networks; SC lossy integrator; SC voltage amplifier; catastrophic capacitor faults; charge transfer graph; faulty circuit graph; good circuit graph; mixed signal circuit test; parametric faults; path sensitization technique; switched capacitor biquad filter; switched capacitor circuit testing; Analog circuits; Charge transfer; Circuit faults; Circuit testing; Clocks; Digital circuits; Filters; Switched capacitor circuits; Switching circuits; Voltage;

fLanguage

English

Publisher

ieee

Conference_Titel

VLSI Design, 2003. Proceedings. 16th International Conference on

ISSN

1063-9667

Print_ISBN

0-7695-1868-0

Type

conf

DOI

10.1109/ICVD.2003.1183111

Filename

1183111