DocumentCode
3235550
Title
Changes in output characteristics of broad-band superluminescent diodes in the process of long-term operation
Author
Andreeva, E.V. ; Ilchenko, S.N. ; Kostin, Yu O. ; Lapin, P.I. ; Mamedov, D.S. ; Yakubovich, S.D.
Author_Institution
SUPERLUM DIODES Ltd., Moscow, Russia
fYear
2011
fDate
5-9 Sept. 2011
Firstpage
1
Lastpage
3
Abstract
Methods and results of reliability tests of SQW broad-band superluminescent diodes (SLD-37 series), widely used in optical coherence tomography (OCT) are presented. Main attention was paid to the alteration of SLD spectral characteristics in the aging process. It is shown that the usage of these methods in the input control of processed epiwafers deployed in the production of active elements for SLD-modules ensures the estimation of their expected life time (MTTF).
Keywords
ageing; optical tomography; semiconductor device reliability; semiconductor quantum wells; superluminescent diodes; SLD spectral characteristics; SLD-37 series; SLD-modules; SQW broadband superluminescent diodes; aging process; long-term operation; optical coherence tomography; reliability tests; RNA; Reliability; Superluminescent diodes;
fLanguage
English
Publisher
ieee
Conference_Titel
Laser and Fiber-Optical Networks Modeling (LFNM), 2011 11th International Conference on
Conference_Location
Kharkov
ISSN
Pending
Print_ISBN
978-1-61284-811-2
Type
conf
DOI
10.1109/LFNM.2011.6144986
Filename
6144986
Link To Document