DocumentCode
3235694
Title
Design approaches for developing a high density, high performance analog test instrument
Author
Kaushansky, David
Author_Institution
Assembly Test Div., Teradyne, North Reading, MA
fYear
2008
fDate
8-11 Sept. 2008
Firstpage
428
Lastpage
432
Abstract
This paper describes the techniques and technologies used to create a high performance, high density, multi-functional analog test instrument. Overcoming density challenges, while maintaining optimal performance levels, requires the careful selection of parts in order to balance functionality, power dissipation, and board area. This paper discusses technologies such as a custom analog ASIC, semi-custom cooling, programmable digital logic, and PCB materials, and how these elements combine to result in a highly functional analog test design in a minimized footprint.
Keywords
analogue integrated circuits; automatic test equipment; printed circuit design; printed circuit testing; PCB materials; analog test design; analog test instrument; custom analog ASIC; design approaches; high density; high performance; programmable digital logic; semi custom cooling; Application specific integrated circuits; Circuit testing; Connectors; Cooling; Instruments; Logic testing; Packaging; Power dissipation; Space technology; Thermal resistance; Analog Test Instrument; Density; Design; Performance;
fLanguage
English
Publisher
ieee
Conference_Titel
AUTOTESTCON, 2008 IEEE
Conference_Location
Salt Lake Cirty, UT
ISSN
1088-7725
Print_ISBN
978-1-4244-2225-8
Electronic_ISBN
1088-7725
Type
conf
DOI
10.1109/AUTEST.2008.4662652
Filename
4662652
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