• DocumentCode
    3235694
  • Title

    Design approaches for developing a high density, high performance analog test instrument

  • Author

    Kaushansky, David

  • Author_Institution
    Assembly Test Div., Teradyne, North Reading, MA
  • fYear
    2008
  • fDate
    8-11 Sept. 2008
  • Firstpage
    428
  • Lastpage
    432
  • Abstract
    This paper describes the techniques and technologies used to create a high performance, high density, multi-functional analog test instrument. Overcoming density challenges, while maintaining optimal performance levels, requires the careful selection of parts in order to balance functionality, power dissipation, and board area. This paper discusses technologies such as a custom analog ASIC, semi-custom cooling, programmable digital logic, and PCB materials, and how these elements combine to result in a highly functional analog test design in a minimized footprint.
  • Keywords
    analogue integrated circuits; automatic test equipment; printed circuit design; printed circuit testing; PCB materials; analog test design; analog test instrument; custom analog ASIC; design approaches; high density; high performance; programmable digital logic; semi custom cooling; Application specific integrated circuits; Circuit testing; Connectors; Cooling; Instruments; Logic testing; Packaging; Power dissipation; Space technology; Thermal resistance; Analog Test Instrument; Density; Design; Performance;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    AUTOTESTCON, 2008 IEEE
  • Conference_Location
    Salt Lake Cirty, UT
  • ISSN
    1088-7725
  • Print_ISBN
    978-1-4244-2225-8
  • Electronic_ISBN
    1088-7725
  • Type

    conf

  • DOI
    10.1109/AUTEST.2008.4662652
  • Filename
    4662652