DocumentCode
3235937
Title
Suspended nanowire bridge fabricated by focused ion beam as a hydrogen sensor
Author
Choi, Jungwook ; Kim, Jongbaeg
Author_Institution
Sch. of Mech. Eng., Yonsei Univ., Yonsei
fYear
2008
fDate
6-9 Jan. 2008
Firstpage
927
Lastpage
931
Abstract
A highly sensitive hydrogen sensor based on suspended and functionalized single tungsten nanowire is presented. The nanowire sensing structure is formed by Focused Ion Beam-Chemical Vapor Deposition on the batch-fabricated microelectrodes. The tungsten nanowire measures 10 mum in length and 150 nm in diameter, and is suspended 50 mum above the wafer substrate connecting two microelectrodes. The nanowire is then functionalized by Pd-Pt metallization to be sensitive to hydrogen gas. The experimentally characterized hydrogen sensor shows 11.52% of resistance increase to the exposure to 10000 ppm (1%) hydrogen gas and 99% nitrogen gas mixture at room temperature and atmospheric pressure. The lowest hydrogen concentration we measured is 10 ppm with 0.58% corresponding resistance increase.
Keywords
chemical vapour deposition; focused ion beam technology; gas sensors; metallisation; microelectrodes; nanotechnology; nanowires; palladium alloys; platinum alloys; tungsten; PdPt; focused ion beam-chemical vapor deposition; hydrogen sensor; metallization; nanowire sensing structure; suspended nanowire bridge fabrication; tungsten nanowire; Bridges; Chemical vapor deposition; Electrical resistance measurement; Hydrogen; Ion beams; Length measurement; Microelectrodes; Nanostructures; Temperature sensors; Tungsten; FIB-CVD; Functionalized nanowire; Hydrogen sensor; Microelectrodes; Suspended single nanowire;
fLanguage
English
Publisher
ieee
Conference_Titel
Nano/Micro Engineered and Molecular Systems, 2008. NEMS 2008. 3rd IEEE International Conference on
Conference_Location
Sanya
Print_ISBN
978-1-4244-1907-4
Electronic_ISBN
978-1-4244-1908-1
Type
conf
DOI
10.1109/NEMS.2008.4484474
Filename
4484474
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