• DocumentCode
    3236072
  • Title

    Instrument optimization in parallel test system development

  • Author

    Hu Lei-Gang ; Xiao Ming-qing

  • Author_Institution
    ATS Lab., Air Force Eng. Univ., Xian
  • fYear
    2008
  • fDate
    8-11 Sept. 2008
  • Firstpage
    508
  • Lastpage
    511
  • Abstract
    The increase of instruments could enhance the better test efficiency, which could lead to the increase of the parallel test system´s budget as well. To settle this problem, this paper proposed the instrument effectiveness model, and released seasoned engineers from arranging the instruments artificially. Firstly, to clarify the goal of parallel test system development, the efficiency of parallel test and the saving cost of instrument were construed. Secondly, introducing the stochastic theory into the test task scheduling field, static scheduling algorithm was designed, and efficient test sequences were got. Then, the instrument effectiveness model was proposed, which could meet different developers´ needs. At last, the feasibility and rationality of the model were validated by an instance of one parallel system instrument configuration, which could test three some-type UUT simultaneously. The instrument effectiveness model in this paper offers a fine measure to configure the instruments of parallel system, which could not only guides the engineers to develop parallel systems, but also offers similar problems a referential model.
  • Keywords
    automatic test equipment; scheduling; stochastic processes; UUT; instrument configuration; instrument effectiveness model; instrument optimization; parallel test system development; static task scheduling; stochastic theory; test task scheduling; unit under test; Algorithm design and analysis; Cities and towns; Costs; Instruments; Scheduling algorithm; Sequential analysis; Stochastic processes; Switches; System testing; Technology management; Instrument configuration; parallel test; static task scheduling; test efficiency;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    AUTOTESTCON, 2008 IEEE
  • Conference_Location
    Salt Lake Cirty, UT
  • ISSN
    1088-7725
  • Print_ISBN
    978-1-4244-2225-8
  • Electronic_ISBN
    1088-7725
  • Type

    conf

  • DOI
    10.1109/AUTEST.2008.4662670
  • Filename
    4662670