DocumentCode :
3236118
Title :
A new type of MEMS two axis accelerometer based on silicon
Author :
Chen, Shang ; Xue, Chenyang ; Zhang, Wendong ; Xiong, Jijun ; Zhang, Binzhen ; Hu, Jie
Author_Institution :
Nat. Key Lab. for Electron. Meas. Technol., North Univ. of China, Taiyuan
fYear :
2008
fDate :
6-9 Jan. 2008
Firstpage :
959
Lastpage :
964
Abstract :
A new type of MEMS two axis accelerometer based on silicon is presented in this paper. This kind of sensor consists of four vertical cantilever beams with an attached cylinder in the center of the structure. By locating the resistors logically formed the Wheatstone bridge; this sensor can detect acceleration in two direction. It is desirable that the application of ingenious structure of the accelerometer may improve the sensitivity. The mechanical model and piezoresistive effect are used to analyse the sensitivity characteristic of the novel structure. The fabrication is completed using MEMS technology. The test results are presented at last. The experiment results show that both the two direction of the accelerometer have high sensitivity and good linearity. The sensitivity of the accelerometer for X direction is 1.017 mv/g and Y is 0.898 mv/g, the linearity of the X direction is 0.99991 and Y is 0.99945. The frequency response gives a straight and smooth line and the measured resonance frequency is about 670 Hz.
Keywords :
accelerometers; cantilevers; microsensors; piezoresistance; silicon; MEMS accelerometer; MEMS technology; Si; Wheatstone bridge; frequency response; ingenious structure; mechanical model; microsensor; piezoresistive effect; two axis accelerometer; vertical cantilever beams; Acceleration; Accelerometers; Bridge circuits; Linearity; Mechanical sensors; Micromechanical devices; Resistors; Sensor phenomena and characterization; Silicon; Structural beams; MEMS; high sensitivity; silicon; two axis accelerometer;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nano/Micro Engineered and Molecular Systems, 2008. NEMS 2008. 3rd IEEE International Conference on
Conference_Location :
Sanya
Print_ISBN :
978-1-4244-1907-4
Electronic_ISBN :
978-1-4244-1908-1
Type :
conf
DOI :
10.1109/NEMS.2008.4484481
Filename :
4484481
Link To Document :
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