• DocumentCode
    3236118
  • Title

    A new type of MEMS two axis accelerometer based on silicon

  • Author

    Chen, Shang ; Xue, Chenyang ; Zhang, Wendong ; Xiong, Jijun ; Zhang, Binzhen ; Hu, Jie

  • Author_Institution
    Nat. Key Lab. for Electron. Meas. Technol., North Univ. of China, Taiyuan
  • fYear
    2008
  • fDate
    6-9 Jan. 2008
  • Firstpage
    959
  • Lastpage
    964
  • Abstract
    A new type of MEMS two axis accelerometer based on silicon is presented in this paper. This kind of sensor consists of four vertical cantilever beams with an attached cylinder in the center of the structure. By locating the resistors logically formed the Wheatstone bridge; this sensor can detect acceleration in two direction. It is desirable that the application of ingenious structure of the accelerometer may improve the sensitivity. The mechanical model and piezoresistive effect are used to analyse the sensitivity characteristic of the novel structure. The fabrication is completed using MEMS technology. The test results are presented at last. The experiment results show that both the two direction of the accelerometer have high sensitivity and good linearity. The sensitivity of the accelerometer for X direction is 1.017 mv/g and Y is 0.898 mv/g, the linearity of the X direction is 0.99991 and Y is 0.99945. The frequency response gives a straight and smooth line and the measured resonance frequency is about 670 Hz.
  • Keywords
    accelerometers; cantilevers; microsensors; piezoresistance; silicon; MEMS accelerometer; MEMS technology; Si; Wheatstone bridge; frequency response; ingenious structure; mechanical model; microsensor; piezoresistive effect; two axis accelerometer; vertical cantilever beams; Acceleration; Accelerometers; Bridge circuits; Linearity; Mechanical sensors; Micromechanical devices; Resistors; Sensor phenomena and characterization; Silicon; Structural beams; MEMS; high sensitivity; silicon; two axis accelerometer;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nano/Micro Engineered and Molecular Systems, 2008. NEMS 2008. 3rd IEEE International Conference on
  • Conference_Location
    Sanya
  • Print_ISBN
    978-1-4244-1907-4
  • Electronic_ISBN
    978-1-4244-1908-1
  • Type

    conf

  • DOI
    10.1109/NEMS.2008.4484481
  • Filename
    4484481