Title :
Test intellectual property trends, test issues and the wealth of owning test in-house
Author_Institution :
Irwin Centre, XJTAG Ltd., Cambridge
Abstract :
In a recent 1500 mile tour around various automotive companies in mainland Europe, I was amazed to find design engineers who had not heard of JTAG or boundary scan as a test technique. This paper introduces the IEEE 1149.1 standard, how it works, what you can do with it now - right up to examples of advanced use today. I will present some trends which will force any clear-thinking test department to look at JTAGpsilas benefits again, reinforce the importance of designing for test.
Keywords :
automobile industry; boundary scan testing; design for testability; industrial property; IEEE 1149.1 standard; JTAG; automotive companies; boundary scan; designing for test; intellectual property trends; test issues; Automotive engineering; Circuit testing; Cities and towns; Costs; Design engineering; Europe; Intellectual property; Libraries; Manufacturing; Production; 1149.1; Automotive; DFT; JTAG; PCB; board test; boundary scan; test intellectual property;
Conference_Titel :
AUTOTESTCON, 2008 IEEE
Conference_Location :
Salt Lake Cirty, UT
Print_ISBN :
978-1-4244-2225-8
Electronic_ISBN :
1088-7725
DOI :
10.1109/AUTEST.2008.4662675