DocumentCode
3236152
Title
Test intellectual property trends, test issues and the wealth of owning test in-house
Author
Lee, Matt
Author_Institution
Irwin Centre, XJTAG Ltd., Cambridge
fYear
2008
fDate
8-11 Sept. 2008
Firstpage
529
Lastpage
535
Abstract
In a recent 1500 mile tour around various automotive companies in mainland Europe, I was amazed to find design engineers who had not heard of JTAG or boundary scan as a test technique. This paper introduces the IEEE 1149.1 standard, how it works, what you can do with it now - right up to examples of advanced use today. I will present some trends which will force any clear-thinking test department to look at JTAGpsilas benefits again, reinforce the importance of designing for test.
Keywords
automobile industry; boundary scan testing; design for testability; industrial property; IEEE 1149.1 standard; JTAG; automotive companies; boundary scan; designing for test; intellectual property trends; test issues; Automotive engineering; Circuit testing; Cities and towns; Costs; Design engineering; Europe; Intellectual property; Libraries; Manufacturing; Production; 1149.1; Automotive; DFT; JTAG; PCB; board test; boundary scan; test intellectual property;
fLanguage
English
Publisher
ieee
Conference_Titel
AUTOTESTCON, 2008 IEEE
Conference_Location
Salt Lake Cirty, UT
ISSN
1088-7725
Print_ISBN
978-1-4244-2225-8
Electronic_ISBN
1088-7725
Type
conf
DOI
10.1109/AUTEST.2008.4662675
Filename
4662675
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