Title :
Innovative approach to test dramatically cuts IC design cycles
Author_Institution :
Xpress Test Solutions, Inc., USA
Keywords :
Integrated circuit testing; Production;
Conference_Titel :
AUTOTESTCON, 2008 IEEE
Conference_Location :
Salt Lake City, UT, USA
Print_ISBN :
978-1-4244-2225-8
Electronic_ISBN :
1088-7725
DOI :
10.1109/AUTEST.2008.4662679
