Data Acquisition System and Reference Model Used for the Investigation and Verification of the Resistance Tomography System

Author

Dorozhovets, Mykhaylo M. ; Potyranski, Pawel

Author_Institution

Dept. of Inf. & Meas. Technol., Nat. Univ. Lviv Polytech., Lviv

fYear

2005

fDate

5-7 Sept. 2005

Firstpage

36

Lastpage

40

Abstract

In this paper the data acquisition system (DAQ) and metrology verification technique of electrical resistivity tomography system is proposed and investigated. The verification is based on the reference model of resistivity distribution that is constructed as a network of the discrete resistors. Proposed technique permits to verify the DAQ, reconstruction algorithm and approximation effects jointly or separately. The reference network parameters and the stages of the verification algorithm are in details described. The DAQ 6-12-24-electrodes object current excitation and interelectrode voltage measurement using difference method.

Keywords

circuit analysis computing; data acquisition; electric resistance measurement; electrical resistivity; resistors; tomography; DAQ 6-12-24-electrodes object current excitation; data acquisition system; data reference model; discrete resistors; electrical resistivity tomography system; interelectrode voltage measurement; metrology verification technique; resistance tomography verification; Conductivity; Data acquisition; Electric resistance; Electric variables measurement; Electrical resistance measurement; Finite element methods; Metrology; Reconstruction algorithms; Resistors; Tomography; Algorithm and Approximation Errors; Instrumental; Reference Model; Tomography System; Verification;

fLanguage

English

Publisher

ieee

Conference_Titel

Intelligent Data Acquisition and Advanced Computing Systems: Technology and Applications, 2005. IDAACS 2005. IEEE

Conference_Location

Sofia

Print_ISBN

0-7803-9445-3

Electronic_ISBN

0-7803-9446-1

Type

conf

DOI

10.1109/IDAACS.2005.282936

Filename

4062087