DocumentCode
3236872
Title
Efficient RTL power estimation for large designs
Author
Ravi, Srivaths ; Raghunathan, Anand ; Chakradhar, Srimat
Author_Institution
C&C Res. Labs., NEC, Princeton, NJ, USA
fYear
2003
fDate
4-8 Jan. 2003
Firstpage
431
Lastpage
439
Abstract
The adoption of register-transfer level (RTL) sign-off in ASIC design methodologies, and the increasing scale of system-on-chip integration, are leading to unprecedented accuracy and efficiency demands on RT level estimation tools. In this work, we focus on the deployment of a simulation-based RTL power estimation tool in a commercial design flow, and describe several enhancements that improve its efficiency and scalability for large, industrial designs. We profile the computational effort involved in RTL power estimation, and propose a suite of acceleration techniques, including (i) transformation of the enhanced RTL description (functional model with annotations for power estimation) to be more simulator-friendly, (ii) computation vs. storage tradeoffs, and (iii) a novel variation of statistical sampling, called partitioned sampling. Our techniques result in an optimized allocation of the overall computational effort for power estimation and minimize the computational effort involved in the evaluation of power models. Extensive experimental results in the context of a commercial design flow have yielded promising results (e.g., up to 31× reduction in power estimation time with negligible loss of accuracy) on industrial designs of up to 1.25 million transistors. In addition to accurate power estimation for an entire circuit, these acceleration techniques result in superior accuracy of local power estimates for individual components or small sub-circuits, compared to conventional sampling or test-bench compaction techniques.
Keywords
application specific integrated circuits; circuit CAD; circuit simulation; integrated circuit design; logic CAD; logic simulation; sampling methods; RTL power estimation tool; acceleration techniques; computation/storage tradeoffs; enhanced RTL description transformation; estimation efficiency; estimation scalability; large ASIC design; optimized computational effort allocation; partitioned sampling; power estimation time reduction; register-transfer level sign-off; statistical sampling; Acceleration; Application specific integrated circuits; Circuit testing; Computational modeling; Design methodology; Life estimation; Sampling methods; Scalability; System-on-a-chip; Yield estimation;
fLanguage
English
Publisher
ieee
Conference_Titel
VLSI Design, 2003. Proceedings. 16th International Conference on
ISSN
1063-9667
Print_ISBN
0-7695-1868-0
Type
conf
DOI
10.1109/ICVD.2003.1183173
Filename
1183173
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