DocumentCode :
3237341
Title :
Pseudospark discharge-based extreme-ultraviolet radiation source
Author :
Jiang, Chao ; Yao, Q. ; Eccles, B. ; Kuthi, A. ; Gundersen, M.A.
Author_Institution :
Univ. of Southern California, Los Angeles, CA
fYear :
2004
fDate :
23-26 May 2004
Firstpage :
368
Lastpage :
370
Abstract :
This paper presents a study of the pseudospark and the optically triggered pseudospark (BLT) discharge devices as extreme-ultraviolet (EUV) radiation sources. Gas discharge-based EUV sources have potential as compact, robust, and less expensive alternatives, as compared with synchrotron sources and laser-produced plasmas. EUV emission within the 11-17 nm wavelength range is produced by a xenon pseudospark discharge plasma. The plasma was generated in a cylindrical-hollow-electrode geometry with a 3 mm diameter central through hole. The anode and the cathode were separated by a gap distance of 5 mm using a 44 mm o.d. pyrex glass envelope. A Si/Zr filter-coated photodiode was used to observe the EUV emission from the hollow anode side of the self-ignited plasma. UV light, generated from a xenon flash lamp, was incident on the back surface of the hollow cathode as an optical trigger for the pseudospark discharge
Keywords :
flash lamps; photodiodes; plasma production by laser; silicon; sparks; ultraviolet lithography; ultraviolet sources; xenon; zirconium; Si-Zr filter-coated photodiode; UV light; cylindrical-hollow-electrode geometry; extreme-ultraviolet radiation source; gas discharge-based EUV sources; hollow cathode; laser-produced plasmas; optically triggered pseudospark discharge devices; pseudospark discharge source; pyrex glass envelope; self-ignited plasma; synchrotron sources; xenon flash lamp; xenon pseudospark discharge plasma; Anodes; Cathodes; Fault location; Optical filters; Plasma devices; Plasma sources; Plasma waves; Stimulated emission; Ultraviolet sources; Xenon;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Power Modulator Symposium, 2004 and 2004 High-Voltage Workshop. Conference Record of the Twenty-Sixth International
Conference_Location :
San Francisco, CA
Print_ISBN :
0-7803-8586-1
Type :
conf
DOI :
10.1109/MODSYM.2004.1433588
Filename :
1433588
Link To Document :
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