DocumentCode
323746
Title
A spectrally mixed excitation (SMX) vocoder with robust parameter determination
Author
Cho, Yong Duk ; Kim, Moo Young ; Kim, Sang Ryong
Author_Institution
Human & Comput. Interaction Lab., Samsung Adv. Inst. of Technol., Kyungki, South Korea
Volume
2
fYear
1998
fDate
12-15 May 1998
Firstpage
601
Abstract
Sinusoidal speech coders have been widely studied for low bit rate coding around 4 kbit/s. However, the estimation error of the sinusoidal model parameters would seriously degrade the speech quality. In general, the estimation errors are caused by the effects of various types of speech signal or background noise. In this paper we propose a sinusoidal speech coder with robust parameter determination methods. They consist of spectro-temporal autocorrelation method for robust pitch determination, frequency shifting method for robust voicing level measurement, and residual-spectrum magnitude coding method for spectral magnitude compensation. From the experimental results, we can find the robustnesses of the proposed techniques. In addition, informal listening test of the synthesized speech confirms the effectiveness of the incorporated schemes
Keywords
correlation methods; linear predictive coding; parameter estimation; spectral analysis; speech coding; speech synthesis; vector quantisation; vocoders; 4 kbit/s; SMX vocoder; estimation errors; frequency shifting method; informal listening test; low bit rate coding; residual-spectrum magnitude coding method; robust parameter determination; robust pitch determination; robust voicing level measurement; sinusoidal speech coder; spectral magnitude compensation; spectrally mixed excitation vocoder; spectro-temporal autocorrelation method; speech coding; synthesized speech; Autocorrelation; Background noise; Bit rate; Degradation; Estimation error; Noise robustness; Speech coding; Speech enhancement; Speech synthesis; Vocoders;
fLanguage
English
Publisher
ieee
Conference_Titel
Acoustics, Speech and Signal Processing, 1998. Proceedings of the 1998 IEEE International Conference on
Conference_Location
Seattle, WA
ISSN
1520-6149
Print_ISBN
0-7803-4428-6
Type
conf
DOI
10.1109/ICASSP.1998.675336
Filename
675336
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