Title :
Analysis of electromagnetic scattering using UV method enhanced marching-on-in-order time-domain integral equations
Author :
Wang, Q.Q. ; Shi, Y.F. ; Li, M.M. ; Fan, Z.H. ; Chen, R.S.
Author_Institution :
Dept. of Commun. Eng., Nanjing Univ. of Sci. & Technol., Nanjing, China
Abstract :
In this paper, the UV method is utilized to reduce both the memory requirement and computational complexity in time-domain combined field integral equation (TD-CFIE) method to analyze scattering from arbitrarily shaped conducting structures. The UV method takes advantage of the rank-deficiency feature and it is kernel-independent. Different orders of weighted Laguerre polynomials are used as temporal basis functions and the unknown expansion coefficients of the time variable are solved recursively order by order, as the so-called matching-on-in-order procedure. RWG basis function is used as the spatial basis function for its flexibility in modeling arbitrary geometries. The spatial and temporal testing procedures are separate, and both of them are carried on with the Galerkin´s method. Numerical results are given to verify the proposed method.
Keywords :
electromagnetic wave scattering; integral equations; polynomials; Galerkin method; Laguerre polynomials; RWG basis function; UV method; arbitrarily shaped conducting structures; computational complexity; electromagnetic scattering; marching-on-in-order time-domain integral equations; memory requirement; rank-deficiency feature; spatial basis function; spatial testing; temporal basis functions; temporal testing; time-domain combined field integral equation; unknown expansion coefficients; Computational complexity; Electromagnetic analysis; Electromagnetic scattering; Geometry; Integral equations; Moment methods; Polynomials; Solid modeling; Testing; Time domain analysis;
Conference_Titel :
Microwave and Millimeter Wave Technology (ICMMT), 2010 International Conference on
Conference_Location :
Chengdu
Print_ISBN :
978-1-4244-5705-2
DOI :
10.1109/ICMMT.2010.5525272