DocumentCode :
3238492
Title :
Automatic synthesis of equipment recipes from specified wafer-state transitions
Author :
Davis, Joseph C. ; Mozumder, P.K. ; Burch, Richard ; Fernando, Chenjing
Author_Institution :
Texas Instrum. Inc., Dallas, TX, USA
fYear :
1997
fDate :
35589
Firstpage :
62
Lastpage :
65
Abstract :
Run-to-run and supervisory control algorithms determine the equipment recipe to produce a desired output wafer state given the Incoming wafer state and the current equipment model. For linear or univariate non-linear equipment models, this problem is trivial. However, when there are multiple responses for the system and the equipment models are nonlinear, the automated synthesis of recipes is complicated by the potential for multiple solutions. We present a framework for performing automated synthesis of recipes that imposes quasi-continuity on the extracted recipes, is scalable to systems of high dimensionality, and performs very quickly. The framework relies on a hierarchical approach that uses pre-determined starting points and local optimisation to determine the best recipe for a given wafer-state transition. A test implementation of this system has shown very good performance
Keywords :
electronic engineering computing; integrated circuit manufacture; optimisation; production control; production engineering computing; IC production; automatic synthesis; equipment recipes; hierarchical approach; local optimisation; multiple responses; nonlinear equipment models; recipe synthesis algorithm; run-to-run control algorithms; specified wafer-state transitions; supervisory control algorithms; Ear; Instruments; Performance evaluation; Sampling methods; Semiconductor device modeling; Supervisory control; System testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Statistical Metrology, 1997 2nd International Workshop on
Conference_Location :
Kyoto
Print_ISBN :
0-7803-3737-9
Type :
conf
DOI :
10.1109/IWSTM.1997.629414
Filename :
629414
Link To Document :
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