DocumentCode
3238710
Title
Efficient circuit-level modelling of ballistic CNT using piecewise non-linear approximation of mobile charge density
Author
Kazmierski, Tom J. ; Zhou, Dafeng ; Al-Hashimi, Bashir M.
Author_Institution
Sch. of Electron. & Comput. Sci., Southampton Univ., Southampton
fYear
2008
fDate
10-14 March 2008
Firstpage
146
Lastpage
151
Abstract
This paper presents a new carbon nanotube transistor (CNT) modelling technique which is based on an efficient numerical piece-wise non-linear approximation of the non-equilibrium mobile charge density. The technique facilitates the solution of the self-consistent voltage equation in a carbon nanotube such that the CNT drain-source current evaluation is accelerated by more than three orders of magnitude while maintaining high modelling accuracy. The model is currently limited to ballistic transport but can be extended to non-ballistic modes of transport when a suitable theory is developed while researchers study phenomena that sometimes prevent electrons in a carbon nanotube from going ballistic. Our results show that while the accuracy and speed of the proposed model vary with the number of piece-wise segments in the mobile charge approximation, it is possible to obtain a speed-up of more than 1000 times while maintaining the accuracy within less than 2% in terms of average RMS error compared with the state of the art theoretical reference CNT model implemented in FETToy. This numerical efficiency makes our model particularly suitable for implementation in circuit-level, eg. SPICE-like, simulators where large numbers of such devices may be used to build complex circuits.
Keywords
approximation theory; carbon nanotubes; integrated circuit design; nanoelectronics; nanotube devices; piecewise polynomial techniques; transistors; CNT drain-source current evaluation; FETToy; average RMS error; ballistic transport; carbon nanotube transistor modelling technique; circuit-level modelling; mobile charge approximation; nonballistic transport modes; nonequilibrium mobile charge density; numerical piece-wise nonlinear approximation; self-consistent voltage equation; Carbon nanotubes; Central Processing Unit; Circuit simulation; Integral equations; Mathematical model; Mobile computing; Nonlinear equations; Probability distribution; Transistors; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Design, Automation and Test in Europe, 2008. DATE '08
Conference_Location
Munich
Print_ISBN
978-3-9810801-3-1
Electronic_ISBN
978-3-9810801-4-8
Type
conf
DOI
10.1109/DATE.2008.4484677
Filename
4484677
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