Title :
Frequency dispersion in partially depleted SOI MOSFET output resistance
Author :
Fung, Samuel K H ; Wong, Man Kit ; Chan, Mansun ; Nguyen, Cuong T. ; Ko, Ping K.
Author_Institution :
Dept. of EEE, Hong Kong Univ. of Sci. & Technol., Clear Water Bay, Hong Kong
fDate :
30 Sep-3 Oct 1996
Abstract :
Floating body effect (FBE) in partially depleted SOI MOSFET has become the focus of research recently. So far, most researcher concentrated their study on switching type circuit operation. However, in order to quantify the impact of floating body on analog circuit, small signal characteristic in frequency domain should be investigated. This paper reports an enhancement of output resistance (Rout) at high frequency in partially depleted devices. The effect is explained by the floating body potential fluctuation under the influence of hole accumulation in the neutral body and gate coupling. At high current level, self heating effect overrides FBE and decreases Rout at high frequency
Keywords :
MOSFET; silicon-on-insulator; analog circuit; floating body effect; frequency dispersion; high frequency; output resistance; partially depleted SOI MOSFET; potential fluctuation; self heating; small signal characteristics; Capacitance; Diodes; Electron devices; Equivalent circuits; Fluctuations; Frequency; Heating; Immune system; MOSFET circuits; Partial discharges;
Conference_Titel :
SOI Conference, 1996. Proceedings., 1996 IEEE International
Conference_Location :
Sanibel Island, FL
Print_ISBN :
0-7803-3315-2
DOI :
10.1109/SOI.1996.552536