• DocumentCode
    3238978
  • Title

    Resilient Dynamic Power Management under Uncertainty

  • Author

    Jung, Hwisung ; Pedram, Massoud

  • Author_Institution
    Dept. of Electr. Eng., Univ. of Southern California, Los Angeles, CA
  • fYear
    2008
  • fDate
    10-14 March 2008
  • Firstpage
    224
  • Lastpage
    229
  • Abstract
    With the increasing levels of variability and randomness in the characteristics and behavior of manufactured nanoscale structures and devices, achieving performance optimization under process, voltage, and temperature (PVT) variations as well as current, voltage, and thermal (CVT) stress has become a daunting, yet vital, task. In this paper, we present a stochastic dynamic power management (DPM) framework to improve the accuracy of decision making under probabilistic conditions induced by PVT variations and/or stress. More precisely, we propose a resilient power management technique that guarantees to select an optimal policy under sources of uncertainty. A key characteristic of the proposed technique is that the effects of uncertainties due to variability and stress are captured by stochastic processes which control a self- improving power manager. Simulation results with a 65 nm processor design show that, compared to the worst-case PVT conditions, the proposed DPM technique ensures energy efficiency, while reducing the uncertain behaviors of the system.
  • Keywords
    decision making; microprocessor chips; nanoelectronics; decision making; dynamic power management; nanoscale devices; process variation; processor design; temperature variation; voltage variation; Energy management; Manufacturing processes; Nanoscale devices; Nanostructures; Optimization; Stochastic processes; Temperature; Thermal stresses; Uncertainty; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design, Automation and Test in Europe, 2008. DATE '08
  • Conference_Location
    Munich
  • Print_ISBN
    978-3-9810801-3-1
  • Electronic_ISBN
    978-3-9810801-4-8
  • Type

    conf

  • DOI
    10.1109/DATE.2008.4484690
  • Filename
    4484690