• DocumentCode
    3239023
  • Title

    Dynamic Voltage Scaling of Supply and Body Bias Exploiting Software Runtime Distribution

  • Author

    Hong, Sungpack ; Yoo, Sungjoo ; Byeong Bin ; Choi, Kyu-Myung ; Eo, Soo-Kwan ; Kim, Taehwan

  • Author_Institution
    Dept. fo EE, Stanford Univ., Stanford, CA
  • fYear
    2008
  • fDate
    10-14 March 2008
  • Firstpage
    242
  • Lastpage
    247
  • Abstract
    This paper presents a method of dynamic voltage scaling (DVS) that tackles both switching and leakage power with combined Vdd/Vbs scaling and gives minimum average energy consumption exploiting the runtime distribution of software execution. We present a mathematical formulation of the DVS problem and an efficient numerical solution. Experimental results show that the presented method shows up to 44% further reduction in energy consumption compared with existing methods. Especially, when the leakage power consumption is significant, i.e. when temperature is high, the presented method is proven to be the most effective.
  • Keywords
    logic design; microprocessor chips; dynamic voltage scaling; energy consumption; leakage power consumption; software execution; software runtime distribution; switching power; Constraint optimization; Dynamic voltage scaling; Energy consumption; Frequency estimation; Optimization methods; Runtime; Software performance; Statistical analysis; Temperature; Voltage control;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design, Automation and Test in Europe, 2008. DATE '08
  • Conference_Location
    Munich
  • Print_ISBN
    978-3-9810801-3-1
  • Electronic_ISBN
    978-3-9810801-4-8
  • Type

    conf

  • DOI
    10.1109/DATE.2008.4484693
  • Filename
    4484693