DocumentCode
3239023
Title
Dynamic Voltage Scaling of Supply and Body Bias Exploiting Software Runtime Distribution
Author
Hong, Sungpack ; Yoo, Sungjoo ; Byeong Bin ; Choi, Kyu-Myung ; Eo, Soo-Kwan ; Kim, Taehwan
Author_Institution
Dept. fo EE, Stanford Univ., Stanford, CA
fYear
2008
fDate
10-14 March 2008
Firstpage
242
Lastpage
247
Abstract
This paper presents a method of dynamic voltage scaling (DVS) that tackles both switching and leakage power with combined Vdd/Vbs scaling and gives minimum average energy consumption exploiting the runtime distribution of software execution. We present a mathematical formulation of the DVS problem and an efficient numerical solution. Experimental results show that the presented method shows up to 44% further reduction in energy consumption compared with existing methods. Especially, when the leakage power consumption is significant, i.e. when temperature is high, the presented method is proven to be the most effective.
Keywords
logic design; microprocessor chips; dynamic voltage scaling; energy consumption; leakage power consumption; software execution; software runtime distribution; switching power; Constraint optimization; Dynamic voltage scaling; Energy consumption; Frequency estimation; Optimization methods; Runtime; Software performance; Statistical analysis; Temperature; Voltage control;
fLanguage
English
Publisher
ieee
Conference_Titel
Design, Automation and Test in Europe, 2008. DATE '08
Conference_Location
Munich
Print_ISBN
978-3-9810801-3-1
Electronic_ISBN
978-3-9810801-4-8
Type
conf
DOI
10.1109/DATE.2008.4484693
Filename
4484693
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