• DocumentCode
    3239258
  • Title

    Locating Signal Line Defects with Thermal Image Analysis

  • Author

    Thompson, M. ; Brusso, P.

  • Author_Institution
    IBM Corporation, STD-Endicott, NY
  • fYear
    1987
  • fDate
    31896
  • Firstpage
    173
  • Lastpage
    183
  • Keywords
    Circuit faults; Electric resistance; Electrical fault detection; Image analysis; Paper technology; Printed circuits; Professional communication; Sections; Thermal conductivity; Thermal engineering;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Southern Tier Technical Conference, 1987. Proceedings of the 1987 IEEE
  • Type

    conf

  • DOI
    10.1109/STIER.1987.716391
  • Filename
    716391
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3239258