• DocumentCode
    3239282
  • Title

    A fast-switching intelligent power MOSFET with thermal protection and negative gate protection

  • Author

    Sakamoto, Kozo ; Fuchigami, Nobutaka ; Tsunoda, Hideki ; Yanokura, Eiji

  • Author_Institution
    Semicond. & Intergrated Circuits Div., Hitachi Ltd., Tokyo, Japan
  • fYear
    1997
  • fDate
    26-29 May 1997
  • Firstpage
    189
  • Lastpage
    192
  • Abstract
    Recently, thermal protection circuits have been added to power MOSFETs to improve their reliability. However, integrating a protection circuit into a power MOSFET causes parasitic bipolar transistors to form. These parasitic bipolar transistors cause a leakage that passes from the drain terminal to the gate terminal when a negative gate voltage is applied against a source voltage. Therefore, these MOSFETs cannot be used in a high-side switch circuit without some form of negative gate protection. To solve this problem, we proposed an intelligent power MOSFET with built-in thermal protection and negative gate protection, which we called the thermal FET. However, the switching speed of this MOSFET is fairly slow because it includes a gate resistor of about 5 to 10 kΩ in its thermal shutdown circuit. Here, we describe a fast-switching intelligent power MOSFET whose switching speed is about two orders of magnitude faster than our previous thermal FET. This was achieved by replacing the gate resistor with a MOSFET. We also developed a new form of negative gate protection for the additional MOSFET. We call this highly reliable fast-switching intelligent power MOSFET an FS-Thermal FET. The FS-Thermal FET can be used in the upper arms of H-bridge circuits and high-side switch circuits, as well as in low-side switch circuits, with this new form of negative gate protection
  • Keywords
    MOS integrated circuits; bridge circuits; field effect transistor switches; integrated circuit reliability; power MOSFET; power field effect transistors; power integrated circuits; power semiconductor switches; protection; semiconductor device reliability; FS-thermal FET; H-bridge circuits; built-in protection; fast-switching power MOSFET; high-side switch circuit; intelligent power MOSFET; low-side switch circuits; negative gate protection; parasitic bipolar transistors; thermal protection; thermal shutdown circuit; Bipolar transistors; FETs; Integrated circuit reliability; MOSFET circuits; Power MOSFET; Protection; Resistors; Switches; Switching circuits; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Power Semiconductor Devices and IC's, 1997. ISPSD '97., 1997 IEEE International Symposium on
  • Conference_Location
    Weimar
  • ISSN
    1063-6854
  • Print_ISBN
    0-7803-3993-2
  • Type

    conf

  • DOI
    10.1109/ISPSD.1997.601467
  • Filename
    601467