• DocumentCode
    3239474
  • Title

    In-band Cross-Trigger Event Transmission for Transaction-Based Debug

  • Author

    Tang, Shan ; Xu, Qiang

  • Author_Institution
    Dept. of Comput. Sci. & Eng., Chinese Univ. of Hong Kong, Hong Kong
  • fYear
    2008
  • fDate
    10-14 March 2008
  • Firstpage
    414
  • Lastpage
    419
  • Abstract
    Cross-trigger, the mechanism to trigger activities in one debug entity from debug events happened in another debug entity, is a very useful technique for debugging applications involving multiple embedded cores. Existing solutions rely on dedicated interconnects (i.e., different from functional interconnects) to transfer debug events and cannot guarantee the arrival time of the debug events coincides with the arrival time of the data messages between multiple cores. This results in mismatches between the observed system internal operations and the ones that designers expect to watch. To tackle the above problem, in this paper, we propose to package the cross-trigger events and the actual data together into transaction messages and transfer them along the same functional interconnects (namely in- band debug event transmission), with the help of novel design-for- debug circuits. Simulation results on a hypothetical NoC-based systems show the effectiveness of the proposed technique.
  • Keywords
    computer debugging; electronic messaging; network-on-chip; cross-trigger event transmission; data messages; functional interconnects; hypothetical NoC-based systems; in-band event transmission; multiple embedded cores; transaction messages; transaction-based debug; transfer debug events; Application software; Computer bugs; Computer science; Debugging; Digital signal processing; Integrated circuit interconnections; Network-on-a-chip; Protocols; System-on-a-chip; Watches;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design, Automation and Test in Europe, 2008. DATE '08
  • Conference_Location
    Munich
  • Print_ISBN
    978-3-9810801-3-1
  • Electronic_ISBN
    978-3-9810801-4-8
  • Type

    conf

  • DOI
    10.1109/DATE.2008.4484716
  • Filename
    4484716