Title :
Low power test set embedding based on phase shifters
Author :
Bellos, Maciej ; Kagaris, Dimitri ; Nikolos, Dimitris
Author_Institution :
Dept. of Comput. Eng. & Inf., Patras Univ., Greece
Abstract :
A new efficient method for test set embedding based on phase shifters was recently proposed This method suffers from high average and peak power consumption. In this work we propose a new phase shifter-based test set embedding method, which, by using interleaving and two LFSRs that change state in a non-overlapping way, significantly reduces the average and peak power consumption.
Keywords :
VLSI; built-in self test; integrated circuit testing; low-power electronics; phase shifters; LFSRs; average power consumption; interleaving; low power test set embedding; nonoverlapping; peak power consumption; phase shifters; Automatic testing; Built-in self-test; Circuit faults; Circuit testing; Embedded computing; Energy consumption; Integrated circuit testing; Phase shifters; Power engineering and energy; Power engineering computing;
Conference_Titel :
VLSI, 2003. Proceedings. IEEE Computer Society Annual Symposium on
Print_ISBN :
0-7695-1904-0
DOI :
10.1109/ISVLSI.2003.1183367
