Low power test set embedding based on phase shifters

Author

Bellos, Maciej ; Kagaris, Dimitri ; Nikolos, Dimitris

Author_Institution

Dept. of Comput. Eng. & Inf., Patras Univ., Greece

fYear

2003

fDate

20-21 Feb. 2003

Firstpage

155

Lastpage

160

Abstract

A new efficient method for test set embedding based on phase shifters was recently proposed This method suffers from high average and peak power consumption. In this work we propose a new phase shifter-based test set embedding method, which, by using interleaving and two LFSRs that change state in a non-overlapping way, significantly reduces the average and peak power consumption.

Keywords

VLSI; built-in self test; integrated circuit testing; low-power electronics; phase shifters; LFSRs; average power consumption; interleaving; low power test set embedding; nonoverlapping; peak power consumption; phase shifters; Automatic testing; Built-in self-test; Circuit faults; Circuit testing; Embedded computing; Energy consumption; Integrated circuit testing; Phase shifters; Power engineering and energy; Power engineering computing;

fLanguage

English

Publisher

ieee

Conference_Titel

VLSI, 2003. Proceedings. IEEE Computer Society Annual Symposium on

Print_ISBN

0-7695-1904-0

Type

conf

DOI

10.1109/ISVLSI.2003.1183367

Filename

1183367

Link To Document

https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3240716