Title :
Defect Tolerance in Homogeneous Manycore Processors Using Core-Level Redundancy with Unified Topology
Author :
Lei Zhang ; Yinhe Han ; Qiang Xu ; Xiaowei Li
Author_Institution :
Key Lab. of Comput. Syst. & Archit., Chinese Acad. of Sci., Beijing
Abstract :
Homogeneous manycore processors are emerging for tera-scale computation. Effective defect tolerance techniques are essential to improve the yield of such complex integrated circuits. In this paper, we propose to achieve fault tolerance by employing redundancy at the core-level instead of at the microarchitecture-level. When faulty cores existing on-chip in this architecture, how to reconfigure the processor with the most effective topology is a relevant research problem. We present novel solutions for this problem, which not only maximize the performance of the manycore processor, but also provide a unified topology to operating system and application software running on the processor. Experimental results show the effectiveness of the proposed techniques.
Keywords :
fault tolerance; microprocessor chips; redundancy; system-on-chip; complex integrated circuit yield; core-level redundancy; defect tolerance techniques; homogeneous manycore processors; on-chip architecture; operating system unified topology; tera-scale computation; Circuit faults; Computer architecture; Manufacturing processes; Microarchitecture; Multicore processing; Network-on-a-chip; Operating systems; Programming profession; Redundancy; Topology;
Conference_Titel :
Design, Automation and Test in Europe, 2008. DATE '08
Conference_Location :
Munich
Print_ISBN :
978-3-9810801-3-1
Electronic_ISBN :
978-3-9810801-4-8
DOI :
10.1109/DATE.2008.4484787