DocumentCode :
3240860
Title :
Hamming product code with iterative process for NAND flash memory controller
Author :
Kim, Luhee ; Yong Jee
Author_Institution :
Dept. of Electron. Eng., Sogang Univ., Seoul, South Korea
fYear :
2010
fDate :
2-4 Nov. 2010
Firstpage :
611
Lastpage :
615
Abstract :
This paper presents a (32640, 30720, 224) iterative Hamming product code for forward error correction (FEC) in multi-level cell (MLC) NAND flash memory systems. The proposed code consists of folded product codes with processing (2040, 1920, 14) Hamming product codes, reiteratively, which are designed to be able to correct multiple burst or random errors. Experimental results show that coding gain is 1.6 dB at 10-9 of bit error probability, redundancy 6.3%, the number of iterating decoding process 16, and its bandwidth 3.17 Gbps, when implemented with a high speed FPGA.
Keywords :
Hamming codes; flash memories; forward error correction; Hamming product codes; MLC NAND flash memory systems; NAND flash memory controller; folded product codes; forward error correction; iterative Hamming product code; iterative process; multilevel cell; Clocks; Logic gates; Sun; System-on-a-chip; NAND flash memory; error correction code; iterative Hamming code; product code;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Computer Technology and Development (ICCTD), 2010 2nd International Conference on
Conference_Location :
Cairo
Print_ISBN :
978-1-4244-8844-5
Electronic_ISBN :
978-1-4244-8845-2
Type :
conf
DOI :
10.1109/ICCTD.2010.5645968
Filename :
5645968
Link To Document :
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